Kennewick, WA, United States of America

Elizabeth R Jurrus

This inventor holds 2 USPTO granted patents. Top assignee: Battelle Memorial Institute. Active years: 2009-2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Elizabeth R Jurrus. Retrieved from https://idiyas.com/inventor/elizabeth-r-jurrus

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 5.0

ph-index = 2

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 2009-2011

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2 patents (USPTO):Explore Patents

Title: Innovations of Elizabeth R Jurrus

Introduction

Elizabeth R Jurrus is a notable inventor based in Kennewick, WA (US). She has made significant contributions to the field of data mining and visualization. With a total of 2 patents, her work has garnered attention for its innovative approach to processing event data.

Latest Patents

One of her latest patents focuses on sequential pattern data mining and visualization. This invention involves the operation of one or more processors to extract various event identifiers. These processors are designed to determine display locations that represent different identifiers and corresponding times. The display locations are grouped into sets, each corresponding to different event sequences. An output is generated that corresponds to a visualization of these event sequences.

Career Highlights

Elizabeth is currently associated with the Battelle Memorial Institute, where she continues to develop her innovative ideas. Her work has been instrumental in advancing the understanding of data visualization techniques.

Collaborations

She has collaborated with notable coworkers, including Pak Chung Wong and Wendy E Cowley, contributing to a dynamic research environment.

Conclusion

Elizabeth R Jurrus exemplifies the spirit of innovation through her patents and contributions to data mining and visualization. Her work continues to influence the field and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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