Gif sur Yvette, France

Elisabeth Lahalle

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Thales. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Elisabeth Lahalle. Retrieved from https://idiyas.com/inventor/elisabeth-lahalle

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Elisabeth Lahalle: Innovator in Aircraft Speed Measurement

Introduction

Elisabeth Lahalle is a notable inventor based in Gif sur Yvette, France. She has made significant contributions to the field of aeronautics, particularly in the measurement of aircraft speed. Her innovative approach utilizes advanced technology to enhance the accuracy of speed measurements.

Latest Patents

Elisabeth holds a patent for a "Method and device for measuring the speed of an aircraft by Doppler." This invention focuses on measuring the speed of an aircraft using Doppler laser anemometry, where the aircraft is equipped with a LiDAR system that employs coherent detection. The method involves several steps that improve the precision of speed measurements in aviation.

Career Highlights

Elisabeth is associated with Thales, a leading company in aerospace and defense technology. Her work at Thales has allowed her to develop cutting-edge solutions that address complex challenges in the aviation industry.

Collaborations

Throughout her career, Elisabeth has collaborated with talented individuals such as Gregory Baral-Baron and Xavier Lacondemine. These partnerships have fostered innovation and contributed to the success of her projects.

Conclusion

Elisabeth Lahalle's contributions to aircraft speed measurement demonstrate her expertise and commitment to advancing technology in aviation. Her innovative methods and collaborations continue to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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