Heidelberg, Germany

Elina Van Kempen

This inventor holds 1 USPTO granted patent. Top assignee: Nec Corporation. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Elina Van Kempen. Retrieved from https://idiyas.com/inventor/elina-van-kempen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Elina Van Kempen: Innovator in Secure Aggregation Technology

Introduction

Elina Van Kempen is a prominent inventor based in Heidelberg, Germany. She has made significant contributions to the field of secure data aggregation, showcasing her expertise through her innovative patent.

Latest Patents

Elina holds a patent for a method titled "Single-server secure aggregation with public randomness." This method provides a secure way to aggregate data using public randomness. It involves determining a set of super-clients from a plurality of clients based on public randomness from a random service beacon. The process includes obtaining masked inputs from clients and aggregated random values associated with super-clients. Ultimately, the method aggregates the masked inputs and random values to enhance data security.

Career Highlights

Elina is currently employed at NEC Corporation, where she continues to develop her innovative ideas and contribute to advancements in technology. Her work focuses on enhancing data security and privacy through her patented methods.

Collaborations

Elina collaborates with talented individuals such as Giorgia Azzurra Marson and Claudio Soriente, who contribute to her projects and research endeavors.

Conclusion

Elina Van Kempen is a trailblazer in the field of secure aggregation technology, with her innovative patent reflecting her commitment to enhancing data security. Her contributions are paving the way for future advancements in this critical area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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