This inventor holds 1 USPTO granted patent. Top assignee: Rotlex Ltd.. Active years: 2004.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2004
Title: Eliezer Keren: Innovator in Optical Measurement Technology
Introduction
Eliezer Keren is a notable inventor based in Omer, Israel. He has made significant contributions to the field of optical measurement technology. His innovative approach has led to the development of a unique patent that enhances the understanding of phase objects.
Latest Patents
Eliezer Keren holds a patent for a "Method and apparatus for testing and mapping phase objects." This invention involves a method for measuring the optical parameters of a phase object. It includes recording a moiré pattern viewed through the phase object, which is formed by illuminating two gratings positioned between a diffuse light source and the phase object. The optical parameters of interest are calculated from the moiré pattern, showcasing a sophisticated approach to optical measurement.
Career Highlights
Throughout his career, Eliezer has worked with Rotlex Ltd., where he has applied his expertise in optical technologies. His work has been instrumental in advancing the capabilities of optical testing and measurement.
Collaborations
Eliezer collaborates with Raanan Bavli, contributing to the innovative projects at Rotlex Ltd. Their partnership exemplifies the synergy between talented individuals in the field of optical technology.
Conclusion
Eliezer Keren's contributions to optical measurement technology through his patent and work at Rotlex Ltd. highlight his role as an influential inventor. His innovative methods continue to impact the field positively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile