The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2004
Filed:
Dec. 27, 2001
Applicant:
Inventors:
Eliezer Keren, Omer, IL;
Raanan Bavli, Be′er Sheva, IL;
Assignee:
Rotlex Ltd., Omer, IL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/00 ;
U.S. Cl.
CPC ...
G01B 9/00 ;
Abstract
A method for measuring the optical parameters of a phase object, comprising recording a moiré pattern viewed through said phase object, said moiré pattern being formed by illuminating by means of a source of diffuse light, first and second gratings positioned in the space between said light source and said phase object, wherein the plane of said first grating is parallel to the plane of said second grating, and calculating the optical parameters of interest from said moiré pattern.