New Westminster, Canada

Elie-Jean Raad

This inventor holds 1 USPTO granted patent. Top assignee: Silent Witness Enterprises Ltd.. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Elie-Jean Raad. Retrieved from https://idiyas.com/inventor/elie-jean-raad

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 55(Granted Patents)


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Elie-Jean Raad: Innovator in Infrared Technology

Introduction

Elie-Jean Raad is a notable inventor based in New Westminster, Canada. He has made significant contributions to the field of infrared technology, particularly through his innovative designs and patents. His work has garnered attention for its practical applications and technological advancements.

Latest Patents

Elie-Jean Raad holds a patent for an infrared illuminator housing. This invention showcases his expertise in creating solutions that enhance visibility and functionality in various applications. The patent reflects his commitment to innovation and his ability to address specific technological needs.

Career Highlights

Raad is currently employed at Silent Witness Enterprises Ltd., a company known for its focus on advanced surveillance and security solutions. His role at the company allows him to apply his inventive skills in a practical setting, contributing to the development of cutting-edge products.

Collaborations

Throughout his career, Elie-Jean Raad has collaborated with talented individuals such as Roman P Rak and William E Fenton. These partnerships have enabled him to leverage diverse expertise and enhance the impact of his inventions.

Conclusion

Elie-Jean Raad is a distinguished inventor whose work in infrared technology exemplifies innovation and practical application. His contributions continue to influence the field and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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