Ithaca, NY, United States of America

Eliad Peretz

This inventor holds 1 USPTO granted patent. Top assignee: Cornell University. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eliad Peretz. Retrieved from https://idiyas.com/inventor/eliad-peretz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Eliad Peretz: Innovator in Nanomanufacturing

Introduction

Eliad Peretz is a notable inventor based in Ithaca, NY (US). He has made significant contributions to the field of nanomanufacturing, particularly through his innovative methods that enhance fabrication techniques.

Latest Patents

Eliad Peretz holds a patent for "Methods of nanomanufacturing at fluid interfaces and systems for same." This patent focuses on continuous additive nanomanufacturing at fluid interfaces, known as CANFI. This approach utilizes techniques such as photocuring or 'printing' self-assembled layers. CANFI offers transformative potential by improving spatial resolution, speed, and the range of material compositions that can be printed. Various articles of manufacture can be created using these advanced methods.

Career Highlights

Eliad Peretz is affiliated with Cornell University, where he continues to push the boundaries of nanomanufacturing. His work has garnered attention for its innovative approach and practical applications in various industries.

Collaborations

Eliad has collaborated with notable colleagues, including Tobias Hanrath and Ben Treml, who share his passion for advancing nanotechnology.

Conclusion

Eliad Peretz is a pioneering inventor whose work in nanomanufacturing is shaping the future of fabrication techniques. His contributions are paving the way for new possibilities in material science and engineering.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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