Agoura Hills, CA, United States of America

Eli Amir

This inventor holds 1 USPTO granted patent. Top assignee: Data Products Corporation. Active years: 1996.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eli Amir. Retrieved from https://idiyas.com/inventor/eli-amir

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: Eli Amir - Innovator in Digitally Controlled Printing

Introduction

Eli Amir is a notable inventor based in Agoura Hills, California. He has made significant contributions to the field of printing technology, particularly through his innovative patent related to digitally controlled printing.

Latest Patents

Eli Amir holds a patent for a method and apparatus for performing printing on a substrate based on data representing a pattern composed of a plurality of parallel rows of discrete image elements. This patent addresses the challenge of eliminating visible seams at the boundaries between adjacent strips of printed image elements. By monitoring the data, the system can adjust the spacing between strips to ensure a seamless appearance in the final printed product.

Career Highlights

Eli Amir is associated with Data Products Corporation, where he has applied his expertise in printing technology. His work has contributed to advancements in how digital printing is executed, enhancing the quality and efficiency of printed materials.

Collaborations

Eli has collaborated with talented individuals such as Aki Okada and Leo J Rheingold, who have also contributed to the field of printing technology.

Conclusion

Eli Amir's innovative work in digitally controlled printing showcases his commitment to improving printing technology. His patent reflects a significant advancement in the industry, and his contributions continue to influence the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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