Champaign, IL, United States of America

Elhan Sultan Ersoz

This inventor holds 1 USPTO granted patent, plus 2 CIPO patents. Top assignee: Syngenta Crop Protection Ag. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Elhan Sultan Ersoz. Retrieved from https://idiyas.com/inventor/elhan-sultan-ersoz-m4yu7fmu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

 

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Elhan Sultan Ersoz: Innovator in Plant Genetics

Introduction

Elhan Sultan Ersoz is a notable inventor based in Champaign, Illinois. He has made significant contributions to the field of plant genetics, particularly in enhancing crop yield and drought tolerance.

Latest Patents

Elhan holds a patent for "Genetic regions and genes associated with increased yield in plants." This invention focuses on methods and compositions for identifying, selecting, and producing plants or germplasm that exhibit increased drought tolerance and yield under non-drought conditions compared to control plants. The patent also includes a maize plant and its progeny or seeds derived from the identified germplasm.

Career Highlights

Elhan is currently associated with Syngenta Crop Protection Ag, a leading company in agricultural solutions. His work is pivotal in advancing agricultural practices and improving food security through innovative genetic research.

Collaborations

Elhan has collaborated with esteemed colleagues, including Michael Mahlon Magwire and Robert John Bensen, contributing to a dynamic research environment focused on agricultural advancements.

Conclusion

Elhan Sultan Ersoz's work in plant genetics exemplifies the impact of innovation on agriculture. His contributions are vital for developing crops that can thrive in challenging environmental conditions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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