Richmond Hill, Canada

Elgin DeWar

This inventor holds 1 USPTO granted patent. Top assignee: Ventra Group, Inc.. Active years: 1996.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Elgin DeWar. Retrieved from https://idiyas.com/inventor/elgin-dewar

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: Elgin DeWar: Innovator in Load Rest Technology

Introduction

Elgin DeWar is a notable inventor based in Richmond Hill, Canada. He has made significant contributions to the field of mechanical engineering, particularly with his innovative designs that enhance the functionality of various tools and equipment.

Latest Patents

Elgin DeWar holds a patent for a "Load Rest for Pantograph Jack." This invention features a one-piece load rest that includes reinforcing portions folded under the center, along with fabricating and depending leg portions designed to connect to the upper portion of a jack. This design improves the stability and efficiency of pantograph jacks in various applications.

Career Highlights

DeWar is currently associated with Ventra Group, Inc., where he applies his expertise in engineering and innovation. His work at the company has allowed him to develop practical solutions that address industry needs.

Collaborations

Elgin collaborates with Tony Fabiano, a fellow professional in the field. Their partnership has fostered an environment of creativity and innovation, leading to advancements in their respective projects.

Conclusion

Elgin DeWar's contributions to the field of mechanical engineering, particularly through his patent for a load rest for pantograph jacks, highlight his innovative spirit and dedication to improving technology. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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