Kensington, CA, United States of America

Eleanor J Fulton

This inventor holds 4 USPTO granted patents. Top assignee: Spectra-Physics Gmbh. Active years: 1990-1992.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eleanor J Fulton. Retrieved from https://idiyas.com/inventor/eleanor-j-fulton

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 4

Forward Citations = 88(Granted Patents)


Location History:

  • Berkley, CA (US) (1990)
  • Kensington, CA (US) (1991 - 1992)

Company Filing History:


Years Active: 1990-1992

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4 patents (USPTO):Explore Patents

Title: Eleanor J Fulton: Innovator in Optical Technology

Introduction

Eleanor J Fulton is a prominent inventor based in Kensington, CA (US). She has made significant contributions to the field of optical technology, holding a total of 4 patents. Her work has been instrumental in advancing the capabilities of optical scanning devices.

Latest Patents

One of her latest patents is for a "Window for an Optical Scanner." This innovation showcases her expertise in creating solutions that enhance the functionality and efficiency of optical scanning technologies.

Career Highlights

Eleanor currently works at Spectra-Physics GmbH, where she continues to push the boundaries of optical technology. Her career is marked by a commitment to innovation and excellence in her field.

Collaborations

Eleanor has collaborated with notable coworkers, including Nicolas N Tabet and Neil R Taylor, who share her passion for advancing optical technologies.

Conclusion

Eleanor J Fulton is a trailblazer in the realm of optical technology, with a proven track record of innovation and collaboration. Her contributions continue to shape the future of optical scanning devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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