San Ramon, CA, United States of America

Eldor Reif

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent. Top assignee: Hitachi America, Ltd.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eldor Reif. Retrieved from https://idiyas.com/inventor/eldor-reif

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Eldor Reif: Innovator in 3D Device Simulation Technology

Introduction

Eldor Reif is a notable inventor based in San Ramon, California. He has made significant contributions to the field of 3D simulation technology. His innovative approach has led to the development of a unique platform that enhances the visualization of devices within a facility.

Latest Patents

Eldor Reif holds a patent for a "3D device simulator visualizer platform as a service." This invention focuses on the simulation of devices to be installed in a facility through a high-resolution 3D model. The technology utilizes a high-resolution capture device to create 3D images of a facility, generating a model that allows for the placement and simulation of devices in free space. This capability provides simulated perspective views of the facility from the perspective of the device, enhancing planning and design processes.

Career Highlights

Eldor Reif is currently employed at Hitachi America, Ltd., where he applies his expertise in 3D modeling and simulation. His work at Hitachi has allowed him to collaborate with other professionals in the field, further advancing the technology and its applications.

Collaborations

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Conclusion

Eldor Reif's contributions to 3D simulation technology exemplify the innovative spirit of modern inventors. His work not only enhances the visualization of devices in facilities but also paves the way for future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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