Gregg, TX, United States of America

Elam C Frye, Jr

This inventor holds 3 USPTO granted patents. Top assignee: Frye International Corporation. Active years: 1994-1997.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Elam C Frye, Jr. Retrieved from https://idiyas.com/inventor/elam-c-frye-jr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 3

Forward Citations = 57(Granted Patents)


Location History:

  • Flint, TX (US) (1994)
  • Gregg, TX (US) (1997)
  • Longview, TX (US) (1997)

Company Filing History:


Years Active: 1994-1997

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3 patents (USPTO):Explore Patents

Title: Elam C Frye, Jr: Innovator in Cutting Technology

Introduction

Elam C Frye, Jr. is a notable inventor based in Gregg, TX (US). He has made significant contributions to the field of cutting technology, holding a total of 3 patents. His work has been instrumental in developing innovative solutions that enhance efficiency and precision in various applications.

Latest Patents

Frye's latest patents include a Holder and Slicing Guide and a Cutter Guide. These inventions reflect his commitment to improving the functionality and usability of cutting tools, making them more accessible for users.

Career Highlights

Elam C Frye, Jr. is associated with Frye International Corporation, where he continues to innovate and develop new technologies. His career is marked by a dedication to advancing cutting technology and providing practical solutions for everyday challenges.

Collaborations

Frye has collaborated with Fred M Gore, contributing to the development of innovative products and enhancing the capabilities of their inventions.

Conclusion

Elam C Frye, Jr. stands out as a dedicated inventor whose work in cutting technology has led to valuable patents and advancements in the field. His contributions continue to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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