Union City, CA, United States of America

Ekta Gujral

This inventor holds 1 USPTO granted patent. Top assignee: Walmart Apollo, LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ekta Gujral. Retrieved from https://idiyas.com/inventor/ekta-gujral

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Ekta Gujral and Time-Series Anomaly Detection

Introduction

Ekta Gujral is an inventor associated with Union City, California. Her patent work addresses anomaly detection in large-scale production environments, where identifying unusual patterns in time-series data can help systems respond to potential issues.

Latest Patents

Gujral is named on 1 patent: “Systems and Methods of Anomaly Detection in Large Scale Production Environments Using Time-Series Modeling.” The patent describes receiving time-series data and generating a forecast with a trained, generalized forecasting model that uses a fixed set of characteristic features. The system compares the forecast with the observed data to determine whether an anomaly is present. If an anomaly is identified, it sends a notification to another system associated with that identification.

Career Highlights

Gujral is associated with Walmart Apollo, LLC. Her patent reflects work on applying generalized time-series forecasting to anomaly detection in production environments.

Collaborations

The provided information lists Krishna Koti Keshva Srinivas and Sanjay Valappile Kandy as Gujral’s coworkers. Their inclusion indicates professional connections, though specific collaborative roles in the patent are not stated.

Conclusion

Ekta Gujral’s patented work focuses on using time-series forecasting to identify and report anomalies in large-scale production environments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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