Mumbai, India

Ekramali Kazi

This inventor holds 1 USPTO granted patent. Top assignee: Exabeam, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ekramali Kazi. Retrieved from https://idiyas.com/inventor/ekramali-kazi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Ekramali Kazi and Cybersecurity Detection Assessment

Introduction

Ekramali Kazi is an inventor associated with Mumbai, India, and Exabeam, Inc. His work includes a patent focused on evaluating how effectively a cybersecurity system meets detection objectives.

Latest Patents

Kazi is named on 1 patent: “System, Method, and Computer Program for Assessing a Cybersecurity System’s Ability to Satisfy a Detection Objective.” The invention describes a system that identifies the measures used to implement a cybersecurity detection objective and periodically scores how effectively the system performs each measure. It compares relevant fields with fields extracted by parsers over a defined time window, then combines the measure scores into an objective score. This score reflects the operational effectiveness of the measures during that period.

Career Highlights

Kazi’s patent work addresses the assessment of cybersecurity detection capabilities. The disclosed approach provides a way to evaluate both individual measures and their combined contribution to a detection objective.

Collaborations

Kazi’s listed coworkers include Adam Geller and Ananta Vadlamani. The available information does not specify their roles in the patent or the nature of their collaboration.

Conclusion

Ekramali Kazi’s patented work presents a structured method for measuring how well cybersecurity systems carry out detection objectives, connecting individual operational measures to an overall assessment.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…