This inventor holds 1 USPTO granted patent. Top assignee: Research Development Corporation of Japan. Active years: 1997.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1997
Title: Eiki Adachi: Innovator in Film Thickness Observation
Introduction
Eiki Adachi is a notable inventor based in Ibaraki, Japan. He has made significant contributions to the field of optical measurement, particularly in observing film thickness and refractive index. His innovative approach has implications for various industries, including materials science and optics.
Latest Patents
Eiki Adachi holds a patent for a method to observe film thickness and/or refractive index by color. This patent describes a technique where light beams from a white light source are directed onto the surface of a solid or liquid sample. The reflected light beams are colored due to partial extinction, allowing for the observation of differences in film thickness and refractive index based on the color variations of the reflected light.
Career Highlights
Eiki Adachi is associated with the Research Development Corporation of Japan, where he applies his expertise in optical measurements. His work has contributed to advancements in the understanding of material properties and their applications in technology.
Collaborations
Eiki Adachi has collaborated with Kuniaki Nagayama, further enhancing the research and development efforts in their field.
Conclusion
Eiki Adachi's innovative methods for observing film thickness and refractive index represent a significant advancement in optical measurement techniques. His contributions continue to influence research and development in various scientific fields.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile