Kanagawa, Japan

Eiji Onuma


Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2002

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Eiji Onuma: Innovator in Deterioration Diagnosis Technology

Introduction

Eiji Onuma is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of diagnostic technology, particularly in the assessment of deterioration in materials. His innovative approach combines ultrasonic wave propagation with data analysis to enhance the reliability of diagnostic methods.

Latest Patents

Eiji Onuma holds a patent for a "Method and device for diagnosing deterioration of an article having at least a covering layer organic polymer material." This invention focuses on a systematic method for diagnosing the deterioration of articles that are covered with organic polymer materials. The process involves forming a data group that includes diagnostic characteristic values and corresponding ultrasonic wave propagation characteristics for various samples. The method measures the ultrasonic wave propagation through the covering layer and determines the deterioration diagnostic characteristic based on the collected data.

Career Highlights

Eiji Onuma is associated with Mitsubishi Cable Industries, Ltd., where he has applied his expertise in developing advanced diagnostic technologies. His work has contributed to the improvement of material assessment techniques, making them more efficient and accurate.

Collaborations

Eiji has collaborated with notable colleagues such as Tetsuya Ashida and Tsuyoshi Ikeda. Their combined efforts have furthered the development of innovative solutions in the field of material diagnostics.

Conclusion

Eiji Onuma's contributions to the field of deterioration diagnosis exemplify the impact of innovative thinking in technology. His patent and work at Mitsubishi Cable Industries, Ltd. highlight the importance of advancing diagnostic methods for better material assessment.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…