The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2002
Filed:
Dec. 11, 2000
Tetsuya Ashida, Hyogo, JP;
Tsuyoshi Ikeda, Hyogo, JP;
Junichiro Ikehara, Hyogo, JP;
Masanori Fujii, Hyogo, JP;
Hiroshi Ishibashi, Hyogo, JP;
Yoshiro Habuka, Kanagawa, JP;
Minoru Okamoto, Kanagawa, JP;
Eiji Onuma, Kanagawa, JP;
Hiroshi Kato, late of Hyogo, JP;
Mitsubishi Cable Industries, Ltd., Amagasaki, JP;
Abstract
The invention is directed to a method and apparatus for diagnosing deterioration of an article having at least a covering layer made from an organic polymer material. The method comprises (i) forming a data group for deterioration diagnosis comprising deterioration diagnostic characteristic values and corresponding ultrasonic wave propagation characteristic values for samples having different material specifications, (ii) propagating an ultrasonic wave through the covering layer of the article to measure an ultrasonic wave propagation characteristic of the covering layer, and (iii) determining a corresponding deterioration diagnostic characteristic from the data group for the ultrasonic wave propagation characteristic of the covering layer. The apparatus comprises (i) an ultrasonic wave propagation measuring device comprising an ultrasonic wave transmitting means, an ultrasonic wave receiving means, a delay chip, and a propagation time measuring means, (ii) a storage unit containing a data group for deterioration diagnosis, and (iii) a central processing unit.