Kure, Japan

Eiji Okada


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Eiji Okada: Innovator in Measurement Technology

Introduction

Eiji Okada is a notable inventor based in Kure, Japan. He has made significant contributions to the field of measurement technology, particularly through his innovative patent. His work focuses on enhancing the accuracy and reliability of measuring devices.

Latest Patents

Eiji Okada holds a patent for a "Traverse linearity compensation method and rotational accuracy compensation method of measuring device." This invention includes a traverse linearity data calculating step, a workpiece measurement data calculating step, and a workpiece profile calculating step. The method aims to improve the precision of measurements by compensating for linearity and rotational accuracy.

Career Highlights

Okada is associated with Mitutoyo Corporation, a leading company in precision measurement instruments. His role at Mitutoyo has allowed him to apply his expertise in developing advanced measurement solutions. His innovative approach has contributed to the company's reputation for high-quality measurement tools.

Collaborations

Eiji Okada has worked alongside talented colleagues such as Yoshiyuki Omori and Atsushi Tsuruta. Their collaborative efforts have furthered advancements in measurement technology and have led to the successful development of innovative solutions.

Conclusion

Eiji Okada's contributions to measurement technology through his patent and work at Mitutoyo Corporation highlight his role as a key innovator in the field. His dedication to improving measurement accuracy continues to influence the industry positively.

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