Company Filing History:
Years Active: 2024-2025
Title: Eiji Arima: Innovator in Defect Inspection Technology
Introduction
Eiji Arima is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of defect inspection technology, holding a total of five patents. His work focuses on enhancing the accuracy and efficiency of defect detection in various materials.
Latest Patents
Arima's latest patents include a defect inspection device that features an inclined optical axis in relation to the sample surface. This device calculates the height variation of an illumination spot and adjusts the focus actuator accordingly. Another notable patent is a defect inspection apparatus that utilizes a linear illumination spot and a specialized sensor unit to improve light incident efficiency. These innovations demonstrate his commitment to advancing defect inspection methodologies.
Career Highlights
Eiji Arima is currently employed at Hitachi High-Tech Corporation, where he continues to develop cutting-edge technologies. His expertise in optical systems and defect detection has positioned him as a key figure in his field. His contributions have not only advanced the technology but have also set new standards for quality control in manufacturing processes.
Collaborations
Arima has collaborated with talented individuals such as Toshifumi Honda and Yuta Urano. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.
Conclusion
Eiji Arima's work in defect inspection technology exemplifies the impact of innovative thinking in engineering. His patents reflect a deep understanding of optical systems and a dedication to improving industrial processes. His contributions will undoubtedly influence the future of defect detection and quality assurance.