Espoo, Finland

Eija Ahonen

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Kemira Oyj. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eija Ahonen. Retrieved from https://idiyas.com/inventor/eija-ahonen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Eija Ahonen: Inventor in Cellulose Chemistry.

Introduction

Eija Ahonen is an inventor associated with Espoo, Finland, and Kemira Oyj. Her patent work concerns cationized cellulose, a modified cellulose material produced through a chemical process.

Latest Patents

Ahonen is associated with 1 patent: “Method for Producing Cationized Cellulose and Cationized Cellulose.” The invention describes preparing a concentrated slurry of cellulosic starting material in an alkaline liquid medium containing an organic liquid, then mercerizing the slurry. After mercerization, a cationizing agent is added at a temperature below the medium’s boiling point, allowing the cellulose to react and form cationized cellulose. The reaction may be carried out under an inert atmosphere.

Career Highlights

Ahonen’s listed patent reflects work on methods for modifying cellulose and producing cationized cellulose. The disclosed process specifies a cellulosic starting-material concentration of at least 20 weight percent, calculated on a dry basis relative to the total weight of the liquid medium and starting material.

Collaborations

Ahonen’s listed coworkers include Veli-Matti Vuorenpalo and Jonni Ahlgren. Her company affiliation is Kemira Oyj.

Conclusion

Eija Ahonen’s patent work focuses on a process for producing cationized cellulose through slurry preparation, mercerization, and subsequent cationization.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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