Nagano, Japan

Eiichiro Furihata

This inventor holds 1 USPTO granted patent. Top assignee: Seiko Epson Corporation. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eiichiro Furihata. Retrieved from https://idiyas.com/inventor/eiichiro-furihata

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 11.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Eiichiro Furihata and Manufacturing Process Management

Introduction

Eiichiro Furihata is an inventor associated with Nagano, Japan, and Seiko Epson Corporation. His patent work includes a system designed to help track products as they move through manufacturing processes.

Latest Patents

Furihata is credited with 1 patent: “Process Management Systems and Methods of the Same.” The invention describes a manufacturing process management system in which terminals at different stages of a process flow scan barcodes attached to products and record when processing begins. The system links each product to its processing status and stores that information in a database. When a client PC requests a product’s status, the system retrieves the relevant information and returns it, helping users identify the product’s current position in the manufacturing flow.

Career Highlights

Furihata’s listed patent focuses on making manufacturing progress easier to monitor. By connecting barcode-based process updates with database records, the system supports access to product status across multiple stages of production.

Collaborations

Furihata is associated with Seiko Epson Corporation. Yoshito Tazawa and Lorenzo Lee are identified as coworkers.

Conclusion

Eiichiro Furihata’s patent describes a practical approach to tracking products through manufacturing, using barcode scans and stored process-status information to make their progress easier to follow.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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