Osaka, Japan

Eiichi Ishikawa

This inventor holds 1 USPTO granted patent. Top assignee: Kyocera Mita Corporation. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eiichi Ishikawa. Retrieved from https://idiyas.com/inventor/eiichi-ishikawa-7a20tu2z

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Eiichi Ishikawa: Innovator in Display Label Technology

Introduction

Eiichi Ishikawa is a notable inventor based in Osaka, Japan. He has made significant contributions to the field of display label technology. His innovative approach has led to the development of a unique method that enhances the functionality of display labels.

Latest Patents

Eiichi Ishikawa holds a patent for a method titled "Method for processing separation and rupture portion of display label, display label-attached product, and display label attachment structure." This method involves forming a separation and rupture portion on a display label attached to an object. The process includes attaching a display label with an adhesive layer to the target object and creating a slit that serves as the separation point for easy removal.

Career Highlights

Ishikawa is associated with Kyocera Mita Corporation, where he has been instrumental in advancing display label technologies. His work has not only improved product usability but has also contributed to the efficiency of labeling processes in various applications.

Collaborations

Throughout his career, Eiichi Ishikawa has collaborated with talented individuals such as Takahiro Itoh and Katsuaki Ohnishi. These partnerships have fostered innovation and have led to the successful development of new technologies in the field.

Conclusion

Eiichi Ishikawa's contributions to display label technology exemplify the impact of innovative thinking in practical applications. His patent and work at Kyocera Mita Corporation highlight his role as a key figure in this specialized area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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