Yehud, Israel

Efrat Egozi-Levi

This inventor holds 1 USPTO granted patent. Top assignee: Micro Focus Lcc. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Efrat Egozi-Levi. Retrieved from https://idiyas.com/inventor/efrat-egozi-levi-j7bt52dw

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Efrat Egozi-Levi: Innovator in Predictive Modeling

Introduction

Efrat Egozi-Levi is a notable inventor based in Yehud, Israel. She has made significant contributions to the field of predictive modeling through her innovative patent. Her work focuses on generating recommended inputs that can enhance the accuracy of predictive models.

Latest Patents

Efrat holds a patent titled "Generating recommended inputs." This invention relates to creating sets of recommended inputs aimed at altering predicted results of a predictive model. The process involves accessing a historical set of inputs and results from a database, approximating a function based on this data, and computing the gradient of the function. The ultimate goal is to generate a set of recommended inputs that yield positive results for the predictive model.

Career Highlights

Efrat Egozi-Levi is currently employed at Micro Focus LLC, where she applies her expertise in predictive modeling. Her innovative approach has positioned her as a valuable asset in her field.

Collaborations

Efrat collaborates with talented individuals such as Ohad Assulin and Boaz Shor, contributing to a dynamic work environment that fosters innovation.

Conclusion

Efrat Egozi-Levi's contributions to predictive modeling through her patent demonstrate her commitment to innovation and excellence in her field. Her work continues to influence advancements in predictive technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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