Efrain Nieto

Title: Efrain Nieto and Receiver Bit Error Rate Testing

Introduction

Efrain Nieto is an inventor associated with Boca Raton, Florida, and Motorola Corporation. His patent describes a system that enables a radio device to measure its own bit error rate and communicate the result through an audible signal.

Latest Patents

Nieto’s listed patent, “Measuring Bit Error Rate Performance of a Receiver by the Receiver,” concerns testing the performance of a radio receiver. The system uses a test controller, pattern generator, radio-frequency signal generator, audio receiver, and test environment cell containing the device under test.

Within the radio device, a microprocessor decodes a received digital pattern, compares it with a pattern stored in memory, and calculates the bit error rate. It then controls a sound-generating device to produce an audible signal indicating the result. The test controller correlates the measured bit error rate with a radio-frequency sensitivity level. Nieto is credited with 1 patent in the information provided.

Career Highlights

Nieto’s documented patent work focuses on radio-device testing and receiver performance measurement. The invention’s approach allows the device under test to calculate and acoustically convey its own bit error rate, supporting evaluation of receiver performance.

Collaborations

The supplied information identifies Robert B. Schneider as Nieto’s coworker. It does not specify his role in the patent or the nature of their collaboration.

Conclusion

Efrain Nieto’s listed invention presents a method for measuring receiver bit error rate within a radio device and communicating the result acoustically, reflecting a practical contribution to radio testing technology.