Jerusalem, Israel

Effy Miklatzky


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 24(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Effy Miklatzky: Innovator in Optical Inspection Systems

Introduction

Effy Miklatzky, based in Jerusalem, Israel, is an accomplished inventor known for her significant contributions to the field of optical inspection systems. With one patent to her name, Miklatzky has developed an innovative approach to enhancing imaging technologies, particularly in semiconductor wafer inspections.

Latest Patents

Miklatzky's patent focuses on "Image splitting in optical inspection systems." This inventive concept involves utilizing imaging optics to capture an image of an object, such as a semiconductor wafer, at a defined focal plane. The innovation enables multiple detectors to register portions of the image by splitting it into two, three, or more segments. Utilizing mirrors and other reflective elements, she has designed a system where reflective planes direct different image portions toward various detectors. This method not only enhances the efficiency of optical inspections but also provides significant advancements in identifying defects in semiconductor manufacturing.

Career Highlights

Effy Miklatzky is employed at Applied Materials South East Asia Pte. Ltd., where she applies her expertise in optical inspection technologies. Her work has been instrumental in advancing inspection tools that are crucial for the semiconductor industry, showcasing her dedication to innovation and technological enhancement.

Collaborations

Throughout her career, Miklatzky has worked alongside talented colleagues, including Dov Furman and Shai Silberstein. These collaborations highlight a synergistic approach to innovation, fostering a creative environment that drives successful outcomes in optical inspection systems.

Conclusion

Effy Miklatzky's inventive spirit and dedication to the field have positioned her as a notable inventor within the optical inspection landscape. Her pioneering patent serves as a testament to the critical advancements in imaging technologies, reinforcing the importance of innovation in maintaining the integrity and quality of semiconductor production.

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