This inventor holds 2 USPTO granted patents. Top assignees: Sandia Corporation, Sandia National Laboratories. Active years: 2002.
Company Filing History:
Years Active: 2002
Title: Edwin Y Lee: Innovator in Semiconductor Radiation Detection
Introduction
Edwin Y Lee is a notable inventor based in Livermore, CA (US), recognized for his contributions to the field of semiconductor radiation detection. With a total of 2 patents, Lee has made significant advancements that enhance the performance of radiation detectors used in various applications, including gamma-ray and x-ray spectrometers.
Latest Patents
Lee's latest patents include the "Wafer-fused semiconductor radiation detector" and the "Electron gas grid semiconductor radiation detector (EGGSRAD)." The wafer-fused semiconductor radiation detector is designed to improve the functionality of traditional Frisch grid radiation detectors. It utilizes wafer fusion to insert an electrically conductive grid between two solid semiconductor pieces, optimizing detector performance without being limited by structural dissimilarities. The EGGSRAD employs doping of the semiconductor to create a two-dimensional electron gas, allowing for superior energy resolution and radiation detection sensitivity compared to conventional detectors.
Career Highlights
Throughout his career, Edwin Y Lee has worked with prominent organizations such as Sandia Corporation and Sandia National Laboratories. His work has focused on developing innovative technologies that push the boundaries of semiconductor applications in radiation detection.
Collaborations
Lee has collaborated with various professionals in his field, including Ralph B James, contributing to the advancement of semiconductor technology.
Conclusion
Edwin Y Lee's innovative work in semiconductor radiation detection has led to significant advancements in the field. His patents reflect a commitment to enhancing the performance and sensitivity of radiation detectors, making a lasting impact on the industry.