Chicago, IL, United States of America

Edwin M Westbrook

This inventor holds 1 USPTO granted patent. Top assignee: The United States of America as Represented by the United States. Active years: 1990.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Edwin M Westbrook. Retrieved from https://idiyas.com/inventor/edwin-m-westbrook-65yhmx34

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 33(Granted Patents)


Company Filing History:


Years Active: 1990

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1 patent (USPTO):Explore Patents

Title: Edwin M. Westbrook: Innovator in X-Ray Technology

Introduction

Edwin M. Westbrook is a notable inventor based in Chicago, IL (US). He has made significant contributions to the field of x-ray technology, particularly with his innovative approach to high intensity x-ray sources.

Latest Patents

Westbrook holds a patent for a "High intensity x-ray source using liquid gallium target." This invention utilizes a flowing stream of liquid gallium as a target, with an electron beam impinging directly on the liquid metal. His work in this area has the potential to enhance the efficiency and effectiveness of x-ray sources.

Career Highlights

Westbrook is associated with the United States of America as represented by the United States. His career reflects a commitment to advancing technology in medical imaging and related fields. He has been recognized for his innovative ideas and practical applications in x-ray technology.

Collaborations

Westbrook has collaborated with notable colleagues, including Robert K. Smither and Gordon S. Knapp. These partnerships have contributed to the development and refinement of his inventions.

Conclusion

Edwin M. Westbrook's contributions to x-ray technology exemplify the spirit of innovation. His patent for a high intensity x-ray source using liquid gallium demonstrates his commitment to advancing medical imaging technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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