Rio de Janeiro, Brazil

Edwin German Maldonado Tavara

This inventor holds 1 USPTO granted patent. Top assignee: Halliburton Energy Services, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Edwin German Maldonado Tavara. Retrieved from https://idiyas.com/inventor/edwin-german-maldonado-tavara

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Edwin German Maldonado Tavara and Three-Dimensional Rock Image Analysis.

Introduction

Edwin German Maldonado Tavara is an inventor associated with Rio de Janeiro, Brazil, and Halliburton Energy Services, Inc. His patent work addresses the analysis of geological samples using three-dimensional image segmentation.

Latest Patents

The provided information lists 1 patent for Maldonado Tavara: “Rock Image Analysis Using Three-Dimensional Segmentation.” The invention describes systems and methods for determining geological fabrics from a three-dimensional image of a sample. The method resizes the image, divides it into cubes, and generates orthogonal planes around each cube’s center of mass. It extracts texture features from those planes, groups cubes into clusters based on the features, and uses the clusters to construct a volume for texture analysis.

Career Highlights

Maldonado Tavara is associated with Halliburton Energy Services, Inc., a company working in the energy services sector. His listed invention applies image-processing and segmentation techniques to geological sample analysis.

Collaborations

The available information connects Maldonado Tavara’s patent to Halliburton Energy Services, Inc. It does not specify additional collaborators or co-inventors.

Conclusion

Edwin German Maldonado Tavara’s listed patent combines three-dimensional segmentation and texture analysis to support the study of geological samples.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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