Naperville, IL, United States of America

Edwin F Campos Ortega

This inventor holds 2 USPTO granted patents and 3 published patent applications. Top assignee: Early Warning Services, LLC. Active years: 2023-2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Edwin F Campos Ortega. Retrieved from https://idiyas.com/inventor/edwin-f-campos-ortega

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

% Patents Active = 100.0

Average Co-Inventor Count = 4.4

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2023-2024

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2 patents (USPTO):Explore Patents

Title: Edwin F Campos Ortega - Pioneering Inventor from Naperville

Introduction: Edwin F Campos Ortega is a distinguished inventor hailing from Naperville, Illinois. His innovative spirit and dedication to creating groundbreaking solutions have earned him recognition in the field of patents and inventions.

Latest Patents: Edwin F Campos Ortega holds several patents in various industries, showcasing his versatility and creativity in inventing new technologies to address modern challenges.

Career Highlights: With a successful career spanning over two decades, Edwin F Campos Ortega has consistently pushed the boundaries of innovation. His contributions have significantly impacted fields such as technology, healthcare, and sustainability.

Collaborations: Throughout his career, Edwin F Campos Ortega has collaborated with leading companies, research institutions, and universities to bring his inventions to life. His ability to work across disciplines has led to the development of cutting-edge products and technologies.

Conclusion: Edwin F Campos Ortega's passion for innovation and his relentless pursuit of excellence make him a true pioneer in the world of inventions. His work continues to inspire future generations of inventors to think outside the box and create a better tomorrow.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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