Aachen, Germany

Edwin Buchter

This inventor holds 1 USPTO granted patent. Top assignee: Frauenhofer Society for the Promotion of Applied Research. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Edwin Buchter. Retrieved from https://idiyas.com/inventor/edwin-buchter-j1cn1y6d

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 37(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: Edwin Buchter: Innovator in Laser Technology

Introduction

Edwin Buchter is a notable inventor based in Aachen, Germany. He has made significant contributions to the field of laser technology, particularly in the area of workpiece machining processes. His innovative approach has led to the development of a unique laser beam apparatus.

Latest Patents

Edwin Buchter holds 1 patent for his invention titled "Laser beam apparatus and workpiece machining process." This patent showcases his expertise in utilizing laser technology for efficient machining applications.

Career Highlights

Buchter is affiliated with the Fraunhofer Society for the Promotion of Applied Research, a prestigious research organization known for its advancements in applied sciences. His work at this institution has allowed him to explore and develop cutting-edge technologies in laser applications.

Collaborations

Throughout his career, Edwin Buchter has collaborated with esteemed colleagues such as Winfried Barkhausen and Axel Zwick. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Edwin Buchter's contributions to laser technology exemplify the spirit of innovation in applied research. His work continues to influence the field and inspire future advancements in machining processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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