Philadelphia, PA, United States of America

Edward Stehle

This inventor holds 1 USPTO granted patent. Top assignee: Drexel University. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Edward Stehle. Retrieved from https://idiyas.com/inventor/edward-stehle

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 22(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Edward Stehle and Software Fault Detection

Introduction

Edward Stehle is an inventor associated with Drexel University in Philadelphia, Pennsylvania. His patent work focuses on using computational geometry to identify and respond to software faults.

Latest Patents

Stehle is credited with 1 patent: “Detection, Diagnosis, and Mitigation of Software Faults.” The invention collects runtime measurements from a software application and uses them to define a geometric enclosure representing normal operating conditions. Measurements inside or on the enclosure’s perimeter indicate normal operation, while measurements outside it signal an anomaly or potential failure. In one embodiment, the enclosure is a convex hull in N-dimensional Euclidean space. Depending on the measurements, the system can take actions such as restarting the software or disabling access to a network port.

Career Highlights

Stehle’s patent illustrates an approach to software monitoring that models normal behavior mathematically and uses deviations from that model to guide fault response. His work is associated with Drexel University.

Collaborations

The provided information identifies Kevin M. Lynch and Maxim Shevertalov as Stehle’s coworkers.

Conclusion

Edward Stehle’s patent applies computational geometry to software fault detection, helping distinguish normal operation from anomalous behavior and support appropriate responses.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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