Georgetown, KY, United States of America

Edward R Welch

This inventor holds 1 USPTO granted patent. Top assignee: Toyota Motor Engineering & Manufacturing North America, Inc.. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Edward R Welch. Retrieved from https://idiyas.com/inventor/edward-r-welch

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Edward R Welch: Innovator in I-Beam Wear Assessment Technology

Introduction

Edward R Welch is an accomplished inventor based in Georgetown, KY (US). He has made significant contributions to the field of engineering, particularly in the development of innovative technologies for wear assessment.

Latest Patents

Edward holds a patent for "I-beam wear assessment trolleys and methods for using the same." This invention includes a first sensor assembly that consists of a first upper block, a first lower block, and a first pressure sensor positioned between them. The design incorporates at least one biasing member that ensures the upper and lower blocks are maintained apart, allowing for accurate wear assessment.

Career Highlights

Edward is currently employed at Toyota Motor Engineering & Manufacturing North America, Inc. His work focuses on enhancing the efficiency and reliability of manufacturing processes through innovative engineering solutions. He has been recognized for his contributions to the field and continues to push the boundaries of technology.

Collaborations

Edward has collaborated with notable colleagues such as Tomokazu Okuno and Tetsuya Yamaguchi. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Edward R Welch is a prominent figure in the field of engineering, with a focus on innovative wear assessment technologies. His contributions continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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