Edward P Luke

Title: Edward P Luke: Innovator in Optical Inspection Technology

Introduction

Edward P Luke is a notable inventor based in Oakdale, NY (US). He has made significant contributions to the field of optical inspection technology, particularly in the area of circuit board analysis. His innovative approach has led to the development of a unique system that enhances the accuracy and efficiency of inspecting circuit boards.

Latest Patents

Edward P Luke holds a patent for a "System and method for automatic optical inspection." This patent describes an optical inspection system designed to identify faults on circuit boards, including printed circuit boards and wire scribed circuit boards. The system utilizes a video camera to capture images of hole sites on a wire circuit board, converting these images into electrical video signals. A frame grabber processes these signals into a multitude of pixels, storing information about the color element values of each pixel. The panel feature detector analyzes these color values and provides indications when they correspond to wire features. Additionally, a fault detector circuit uses this information to identify faults associated with predetermined pixels on the circuit board.

Career Highlights

Edward P Luke is currently employed at Advanced Interconnection Technology, Inc. His work at this company has allowed him to apply his innovative ideas in practical settings, contributing to advancements in optical inspection technology.

Collaborations

Throughout his career, Edward has collaborated with talented individuals such as Damien W Creavin and Robert R Reetz. These collaborations have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Edward P Luke's contributions to optical inspection technology exemplify the impact of innovation in the field of circuit board analysis. His patent and work at Advanced Interconnection Technology, Inc. highlight his commitment to enhancing the accuracy of electronic inspections.