Port Orange, FL, United States of America

Edward H Tegge, Jr

This inventor holds 1 USPTO granted patent. Top assignee: General Electric Company. Active years: 1986.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Edward H Tegge, Jr. Retrieved from https://idiyas.com/inventor/edward-h-tegge-jr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 1986

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1 patent (USPTO):Explore Patents

Title: Edward H Tegge, Jr: Innovator in Spatial Pixel Optimization

Introduction

Edward H Tegge, Jr is a notable inventor based in Port Orange, FL (US). He has made significant contributions to the field of video display technology. His innovative approach to enhancing vertical scene resolution has led to the development of a unique patent.

Latest Patents

Tegge holds a patent for a "Spatial pixel optimization technique." This invention modifies the scan pattern of a raster scan video display system to provide a sinusoidal raster scan. The derived scan lines, made up of pixels from adjacent scan lines, enhance vertical scene resolution. A sinusoidal deflection circuit and microdeflection yoke are utilized to produce the desired waveform, while a distortion compensation circuit corrects any distortions of the waveform.

Career Highlights

Edward H Tegge, Jr is associated with General Electric Company, where he has applied his expertise in video display systems. His work has contributed to advancements in display technology, showcasing his innovative spirit and technical skills.

Collaborations

Tegge has collaborated with William S Beamon, III, further enhancing the impact of his work in the field.

Conclusion

Edward H Tegge, Jr is a distinguished inventor whose work in spatial pixel optimization has made a significant impact on video display technology. His contributions continue to influence advancements in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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