Lathrup Village, MI, United States of America

Edward F Borowski

This inventor holds 1 USPTO granted patent. Top assignee: Unisys Corporation. Active years: 1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Edward F Borowski. Retrieved from https://idiyas.com/inventor/edward-f-borowski

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 32(Granted Patents)


Company Filing History:


Years Active: 1994

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1 patent (USPTO):Explore Patents

Title: Edward F. Borowski: Document-Processing Patent Inventor

Introduction

Edward F. Borowski is an inventor associated with Lathrup Village, Michigan, and Unisys Corporation. His patent work addresses ways to organize and analyze information about documents processed by imaging systems.

Latest Patents

Borowski is credited with 1 patent: “Method for Identifying and Tracking Document Characteristics in a Document Image Processing System.” The invention records characteristics of each processed document in an audit file, allowing the information to be reviewed and analyzed later. An analyzer responds to requests for summaries by combining audit-file data with results accumulated in a history file. It groups information by document class and updates the history file as it prepares each summary.

Career Highlights

Borowski’s documented patent contribution focuses on making document characteristics easier to identify, summarize, and analyze. The method supports ongoing analysis by preserving processing details and incorporating prior summary results.

Collaborations

Borowski’s listed coworkers include Lawrence P. Del Ricci and Norman P. Kern. His patent is associated with Unisys Corporation.

Conclusion

Edward F. Borowski’s patent describes a systematic approach to tracking document characteristics and combining current processing data with historical summaries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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