Spiegel, Switzerland

Edgar Stussi

This inventor holds 1 USPTO granted patent. Top assignee: K.k. Holding Ag. Active years: 1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Edgar Stussi. Retrieved from https://idiyas.com/inventor/edgar-stussi-56j2x6tu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: The Innovations of Edgar Stussi

Introduction

Edgar Stussi is an accomplished inventor based in Spiegel, Switzerland. He has made significant contributions to the field of measurement technology, particularly in the area of force measurement during jumping activities. His innovative approach has led to the development of a unique patent that enhances the accuracy and reliability of jump force measurements.

Latest Patents

One of Edgar Stussi's notable patents is the "Portable Jumping Force Measuring Platform." This invention features a measuring platform with three supporting units arranged in a triangle. Each unit is equipped with force measuring sensors and is stabilized by a baseplate. This design allows for the simultaneous measurement of jump-off and landing forces for both single and multiple jumps, regardless of the ground support.

Career Highlights

Edgar Stussi has been associated with K.K. Holding AG, where he has utilized his expertise to further develop innovative measurement solutions. His work has been instrumental in advancing the technology used in sports science and biomechanics.

Collaborations

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Conclusion

Edgar Stussi's contributions to the field of measurement technology, particularly through his portable jumping force measuring platform, demonstrate his commitment to innovation and excellence. His work continues to impact the way jump forces are measured in various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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