Edgar Genio

Title: Edgar Genio: Innovator in Optical Measurement Technology

Introduction

Edgar Genio is a prominent inventor based in Beijing, China. He has made significant contributions to the field of optical measurement technology, holding a total of 3 patents. His work focuses on developing advanced instruments that enhance the precision and efficiency of optical measurements.

Latest Patents

One of Genio's latest patents is a normal incidence broadband spectroscopic polarimeter and optical measurement system. This innovative device is designed to be easy to adjust, free from chromatic aberration, and capable of maintaining polarization while featuring a simple structure. The polarimeter allows the probe beam to achieve normal incidence and focus on the sample surface by utilizing at least one flat reflector element to alter the propagation direction of the focused beam. Additionally, it includes at least one polarizer to measure anisotropic or non-uniform samples, such as three-dimensional profiles and material optical constants of thin films with periodic structures.

Another notable patent is the normal-incidence broadband spectroscopic polarimeter containing a reference beam. This invention comprises a light source, a first reflecting unit, a first concentrating unit, a second concentrating unit, a polarizer, a first curved mirror, a first planar mirror, a second reflecting unit, and a probing unit. The optical measurement system, which includes this polarimeter, achieves an integral combination of light beams after splitting, maintains the polarization state of the light beams, increases light transmission efficiency, and features low complexity.

Career Highlights

Edgar Genio is currently employed at Beioptics Technology Co., Ltd., where he continues to innovate in the field of optical measurement. His work has garnered attention for its practical applications and contributions to advancing measurement technologies.

Collaborations

Genio has collaborated with notable colleagues, including Guoguang Li and Tao Liu. Their combined expertise has further enhanced the development of cutting-edge optical measurement systems.

Conclusion

Edgar Genio's contributions to optical measurement technology through his innovative patents demonstrate his commitment to advancing the field. His work not only showcases his inventive spirit but also highlights the importance of collaboration in achieving technological advancements.