Location History:
- Hedingen, CH (1982 - 1994)
- Schweiz, DE (1994)
Company Filing History:
Years Active: 1982-1994
Title: Edgar F Steigmeier: Innovator in Surface Inspection Technology
Introduction
Edgar F Steigmeier is a notable inventor based in Hedingen, Switzerland. He has made significant contributions to the field of surface inspection technology, holding a total of 6 patents. His work focuses on non-destructive examination methods that enhance the detection of surface defects.
Latest Patents
One of his latest patents is an apparatus for surface inspection. This innovative device allows for the non-destructive examination of entire surfaces for defects and contamination. It can detect microscopically small dot-shaped and linear defects, as well as extremely fine macroscopic non-homogeneous areas. The apparatus utilizes an astigmatic lens system placed in the optical path between a light source and an objective. This system produces a cigar-shaped intermediate image, which is crucial for scanning the surface. Additionally, a dark-field stop assembly with an adjustable dark-field deflection system is integrated into the optical path. This assembly projects the light beam at right angles through the objective onto the surface of the object. The reflected light is collected by the objective and directed to a photo detector. An electronic analysis system processes the output signals from the photo detector, breaking them down into measured values for various types of defects.
Career Highlights
Throughout his career, Edgar has worked with several companies, including RCA Inc. and Tet Techno Trust Investment Settlement. His experience in these organizations has contributed to his expertise in developing advanced inspection technologies.
Collaborations
Edgar has collaborated with notable individuals in his field, including Heinrich Auderset and Harry L Sawatzki. These partnerships have likely enriched his work and led to further innovations in surface inspection.
Conclusion
Edgar F Steigmeier's contributions to surface inspection technology demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the complexities involved in non-destructive testing methods.