London, United Kingdom

Eddie Ruffel

This inventor holds 4 USPTO granted patents and 1 published patent application. Top assignee: Panavision International, L.p.. Active years: 2019-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eddie Ruffel. Retrieved from https://idiyas.com/inventor/eddie-ruffel

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 4 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 2

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2019-2025

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4 patents (USPTO):Explore Patents

Title: Eddie Ruffel: Innovator in Camera Technology

Introduction

Eddie Ruffel is a notable inventor based in London, GB, recognized for his contributions to camera technology. With a total of four patents to his name, he has made significant strides in enhancing the functionality of camera optical elements.

Latest Patents

Among his latest innovations is a patent for a camera optical element featuring a tactile indicator. This apparatus includes a camera optical element and a tactile indicator that indicates a property of the camera optical element. This invention aims to improve user interaction with camera technology, making it more intuitive and accessible.

Career Highlights

Eddie Ruffel is currently employed at Panavision International, L.P., a company renowned for its advanced camera systems and technology. His work at Panavision has allowed him to push the boundaries of camera design and functionality.

Collaborations

Eddie has collaborated with talented individuals such as Haluki Sadahiro and Graham Merritt, contributing to a dynamic work environment that fosters innovation and creativity.

Conclusion

Eddie Ruffel's work in camera technology exemplifies the spirit of innovation, and his patents reflect a commitment to enhancing user experience in photography. His contributions continue to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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