Berkeley, CA, United States of America

Ed Wishnow

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent. Top assignee: Photon Etc, Inc.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ed Wishnow. Retrieved from https://idiyas.com/inventor/ed-wishnow

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Ed Wishnow: Innovator in Spectrographic Imaging

Introduction

Ed Wishnow is a notable inventor based in Berkeley, CA (US). He has made significant contributions to the field of imaging technology, particularly with his innovative approach to capturing high-contrast images of predetermined targets.

Latest Patents

Wishnow holds a patent for a Spectrographic Multi-Band Camera. This invention concerns a method and camera designed to obtain a high-contrast image of a target present in an observation area. The method involves capturing an in-band image of the area using a filter aligned with the target's characteristic wavelength bands, as well as an out-of-band image that excludes the target. The processing of these images results in a high-contrast representation that enhances the detection and monitoring of the target.

Career Highlights

Ed Wishnow has dedicated his career to advancing imaging technologies. His work has led to the development of innovative solutions that improve the clarity and effectiveness of image capture in various applications.

Collaborations

Wishnow collaborates with Sebastien Blais-Ouellette, contributing to the advancement of their projects and innovations in imaging technology.

Conclusion

Ed Wishnow's contributions to the field of imaging through his patented Spectrographic Multi-Band Camera exemplify his commitment to innovation. His work continues to influence the way we capture and analyze images in various settings.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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