This inventor holds 1 USPTO granted patent. Top assignee: Phase Metrics, Inc.. Active years: 1998.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1998
Title: Ed Ross - Innovator in Optical Measurement Technology
Introduction
Ed Ross is a notable inventor based in San Diego, California. He has made significant contributions to the field of optical measurement technology. His innovative work has led to the development of a unique apparatus that enhances the precision of measurements in various applications.
Latest Patents
Ed Ross holds a patent for a "Combined interferometer/ellipsometer for measuring small spacings." This invention provides an advanced method for measuring the space between a transparent member, such as a substrate, and a reflective member, like a slider. The apparatus utilizes a first optical system to detect a light beam reflected from both the substrate and the slider. The reflected light is separated into four distinct beams, allowing for the detection of various stokes parameters. These parameters are crucial for computing the real index of refraction, extinction coefficient, and the thickness of the space. The system is designed to account for any depolarized light reflected from the slider, ensuring accurate measurements.
Career Highlights
Ed Ross is associated with Phase Metrics, Inc., where he continues to innovate in the field of optical measurement. His work has been instrumental in advancing the technology used for precise measurements in various scientific and industrial applications.
Collaborations
Throughout his career, Ed has collaborated with notable colleagues, including Christopher A. Lacey and Kenneth H. Womack. These collaborations have contributed to the development and refinement of his innovative technologies.
Conclusion
Ed Ross is a distinguished inventor whose work in optical measurement technology has made a significant impact. His patented inventions continue to influence the field, showcasing his dedication to innovation and precision in measurement techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile