Riverside, IL, United States of America

Ed Kmet

This inventor holds 1 USPTO granted patent. Top assignee: Sato Holdings Kabushiki Kaisha. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ed Kmet. Retrieved from https://idiyas.com/inventor/ed-kmet

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Ed Kmet - Innovator in Identification Technology

Introduction

Ed Kmet is a notable inventor based in Riverside, Illinois. He has made significant contributions to the field of identification technology. His innovative approach has led to the development of a unique identification band that enhances the way objects are identified.

Latest Patents

Kmet holds a patent for an identification band that includes a strip of material with a transponder supporting portion. This identification band is designed to secure completely around an object using fasteners, creating a loop that facilitates identification. The design includes an air gap between the transponder supporting portion and the outer surface of the loop, which is a key feature of the invention.

Career Highlights

Ed Kmet is associated with Sato Holdings Kabushiki Kaisha, where he applies his expertise in developing innovative identification solutions. His work has been instrumental in advancing the technology used in identification bands.

Collaborations

Kmet has collaborated with talented individuals such as Christopher A. Jones and Kerry Ludden. These partnerships have contributed to the successful development of his inventions.

Conclusion

Ed Kmet's contributions to identification technology through his innovative patent demonstrate his commitment to enhancing object identification methods. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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