VS-Schwenningen, Germany

Eckehart Gortat

This inventor holds 1 USPTO granted patent. Top assignee: Hommelwerke Gmbh. Active years: 1988.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eckehart Gortat. Retrieved from https://idiyas.com/inventor/eckehart-gortat

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 1988

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1 patent (USPTO):Explore Patents

Title: The Innovations of Eckehart Gortat

Introduction

Eckehart Gortat is a notable inventor based in VS-Schwenningen, Germany. He has made significant contributions to the field of engineering, particularly with his innovative designs and patents. His work is recognized for its impact on surface testing technology.

Latest Patents

Eckehart Gortat holds a patent for a surface testing machine. This invention showcases his expertise in developing tools that enhance the accuracy and efficiency of surface testing processes. The patent reflects his commitment to advancing technology in his field.

Career Highlights

Gortat is currently employed at Hommelwerke GmbH, a company known for its precision measurement technology. His role at the company allows him to apply his inventive skills and contribute to the development of high-quality measurement solutions. His career is marked by a dedication to innovation and excellence.

Collaborations

Throughout his career, Eckehart has collaborated with talented individuals such as Bernd Dreier and Karl Hutter. These partnerships have fostered a creative environment that encourages the exchange of ideas and the development of groundbreaking technologies.

Conclusion

Eckehart Gortat's contributions to the field of surface testing technology exemplify his innovative spirit and dedication to engineering. His patent and work at Hommelwerke GmbH highlight his role as a significant figure in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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