Nauborn, Germany

Eckart Delingat

This inventor holds 1 USPTO granted patent. Top assignee: Ernst Leitz Wetzlar Gmbh. Active years: 1981.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eckart Delingat. Retrieved from https://idiyas.com/inventor/eckart-delingat

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1981

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1 patent (USPTO):Explore Patents

Title: The Innovations of Eckart Delingat

Introduction

Eckart Delingat is a notable inventor based in Nauborn, Germany. He has made significant contributions to the field of optical technology. His work focuses on innovative solutions that enhance measurement techniques.

Latest Patents

Eckart Delingat holds a patent for an optical correlator. This invention features an imaging system designed for the non-contact measurement of the velocity, direction of motion, and distance of an object. The optical correlator includes a grating structure with lines positioned near the image plane of the imaging system. Additionally, it incorporates a photoelectric receiver that converts modulated light fluxes into electrical signals. A key improvement in this design is a supplemental structural device that transforms spatial frequencies contained in the image of an object.

Career Highlights

Eckart Delingat is associated with Ernst Leitz Wetzlar GmbH, a company known for its advancements in optical instruments. His work there has contributed to the development of innovative optical technologies.

Collaborations

Eckart Delingat has collaborated with Eckart Schneider, further enhancing the scope of his inventions and research.

Conclusion

Eckart Delingat's contributions to optical technology through his patent and work at Ernst Leitz Wetzlar GmbH highlight his role as an influential inventor in the field. His innovative approaches continue to impact measurement techniques significantly.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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