This inventor holds 1 USPTO granted patent. Top assignee: Heimann Gmbh. Active years: 1989.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1989
Title: The Innovations of Eckart-Alfred Von Unger
Introduction
Eckart-Alfred Von Unger is a notable inventor based in Munich, Germany. He has made significant contributions to the field of technology, particularly in the development of x-ray scanning systems. His innovative approach has led to the creation of a unique x-ray scanner designed for inspecting articles as they move through a conveyor system.
Latest Patents
Eckart-Alfred Von Unger holds a patent for an x-ray scanner that inspects articles moving through it. This scanner features a robust frame that supports an x-ray source, a collimator for the x-ray beam, and a radiation detector. The design of the frame is engineered to resist flexural and torsional stresses, ensuring that the relative positions of the x-ray source, collimator, and radiation receiver remain stable. The scanner is mounted in a rack with a resilient support, which protects the alignment of the components from mechanical stresses caused by heavy articles on the conveyor.
Career Highlights
Eckart-Alfred Von Unger is associated with Heimann GmbH, where he has been instrumental in advancing x-ray technology. His work has not only improved the efficiency of article inspection but has also enhanced safety measures in various industries.
Collaborations
Throughout his career, Eckart-Alfred Von Unger has collaborated with esteemed colleagues such as Gerhard Doenges and Rolf Dietrich. These partnerships have fostered innovation and contributed to the development of cutting-edge technologies in the field.
Conclusion
Eckart-Alfred Von Unger exemplifies the spirit of innovation through his contributions to x-ray scanning technology. His patent for an advanced x-ray scanner showcases his commitment to improving inspection processes in various applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile