Liberty Hill, TX, United States of America

E Keith Howick, Jr

This inventor holds 1 USPTO granted patent. Top assignee: Silicon Metrics Corporation. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: E Keith Howick, Jr. Retrieved from https://idiyas.com/inventor/e-keith-howick-jr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 16(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: E Keith Howick, Jr: Innovator in Circuit Characterization

Introduction

E Keith Howick, Jr. is a notable inventor based in Liberty Hill, TX (US). He has made significant contributions to the field of circuit characterization, showcasing his expertise through his innovative patent.

Latest Patents

His patent, titled "Apparatus for optimized constraint characterization with degradation options and associated methods," presents a circuit-characterization system that includes a computer. The computer utilizes a model of the circuit's operation to characterize the first and second constraints of the circuit. It selects values for these constraints and modifies them to obtain optimized values that avoid an invalid region of operation for the circuit. This invention highlights Howick's ability to enhance circuit performance through advanced characterization techniques. He holds 1 patent.

Career Highlights

E Keith Howick, Jr. is associated with Silicon Metrics Corporation, where he applies his knowledge and skills in circuit design and optimization. His work has contributed to advancements in the field, making him a valuable asset to his company.

Collaborations

He collaborates with Guruprasad G Rao, further enhancing the innovative capabilities within his team.

Conclusion

E Keith Howick, Jr. stands out as an inventor dedicated to improving circuit characterization through his innovative approaches. His contributions continue to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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