Daejeon, South Korea

E Joong Yoon

This inventor holds 1 USPTO granted patent. Top assignee: Electronics and Telecommunications Research Institute. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: E Joong Yoon. Retrieved from https://idiyas.com/inventor/e-joong-yoon-jnk73y1q

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: E Joong Yoon: Innovator in Encryption Technology

Introduction

E Joong Yoon is a notable inventor based in Daejeon, South Korea. He has made significant contributions to the field of encryption technology, particularly in enhancing security measures against differential power analysis attacks.

Latest Patents

E Joong Yoon holds a patent for a "Masking method of defending differential power analysis attack in seed encryption algorithm." This innovative approach involves masking a plurality of S-boxes using a single masking inverse table. As a result, the computation cost and the amount of RAM required for masking during the operation are effectively reduced, thereby improving the efficiency of the SEED encryption algorithm.

Career Highlights

E Joong Yoon is affiliated with the Electronics and Telecommunications Research Institute, where he continues to advance research in encryption technologies. His work is pivotal in developing secure systems that protect sensitive information from potential attacks.

Collaborations

Some of his notable coworkers include Chang Kyun Kim and Chang Ho Jung, who contribute to the collaborative efforts in research and development within the institute.

Conclusion

E Joong Yoon's innovative work in encryption technology exemplifies the importance of developing secure methods to protect data. His contributions are vital in the ongoing battle against cyber threats.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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