Corvallis, OR, United States of America

Dusty R V Berggren

This inventor holds 1 USPTO granted patent. Top assignee: Ch2m Hill, Inc.. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dusty R V Berggren. Retrieved from https://idiyas.com/inventor/dusty-r-v-berggren

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Innovations of Dusty R V Berggren

Introduction

Dusty R V Berggren is an accomplished inventor based in Corvallis, Oregon. He has made significant contributions to the field of environmental testing through his innovative designs. His work focuses on developing devices that enhance the accuracy and efficiency of leach testing.

Latest Patents

Berggren holds a patent for a "Semi-dynamic leach test device and methods of making and using." This patent describes an insert device for semi-dynamic leach testing, which includes a support and an absorptive polymer. The device is characterized by a sheet-like form with a first and second major side. It is particularly useful for testing both radial and unidirectional leaching of organic compounds into water from solid samples.

Career Highlights

Berggren is currently employed at CH2M Hill, Inc., where he applies his expertise in environmental engineering. His work at the company has allowed him to collaborate with other professionals in the field, enhancing the impact of his inventions.

Collaborations

Some of his notable coworkers include Dennis Gregory Grubb and Anthony Dalton-Atha. Their collaboration has contributed to the advancement of environmental testing methodologies.

Conclusion

Dusty R V Berggren's innovative contributions to leach testing devices demonstrate his commitment to improving environmental safety and testing accuracy. His patent reflects a significant advancement in the field, showcasing his expertise and dedication to innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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