Company Filing History:
2 out of 4,671 
1 out of 4,491 
1 out of 164 
Years Active: 1992-2002
Title: Durbin L Seidel: Innovator in Integrated Circuit Testing
Introduction
Durbin L Seidel is a notable inventor based in Fort Collins, CO (US). He has made significant contributions to the field of integrated circuit testing, holding a total of 4 patents. His work has advanced the methods and apparatus used in testing integrated circuit devices, showcasing his expertise and innovative spirit.
Latest Patents
Durbin's latest patents include a method for testing integrated circuit devices. This invention is directed to a method and apparatus for testing integrated circuit package devices using automatic testing equipment. The automatic testing equipment may be provided with a light source to enable the testing of image capture type integrated circuit devices. Alternatively, the automatic testing equipment may be provided with an imaging device, such as a camera, or both an imaging device and a light source to additionally enable the testing of display type integrated circuit devices. Another patent he holds is for an apparatus and method for testing integrated circuit devices, which shares similar features and applications as his previous invention.
Career Highlights
Throughout his career, Durbin has worked with prominent companies such as Agilent Technologies, Inc. and NCR Corporation. His experience in these organizations has allowed him to refine his skills and contribute to the development of innovative testing solutions for integrated circuits.
Collaborations
Durbin has collaborated with notable coworkers, including Bradley D Pace and William Richard Lawrence. Their combined expertise has likely contributed to the success of their projects and innovations in the field.
Conclusion
Durbin L Seidel's contributions to integrated circuit testing demonstrate his commitment to innovation and excellence. His patents and career achievements reflect his significant impact on the industry.